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  Datasheet File OCR Text:
 Bulletin I0124J 07/97
IR180LM..CS02CB SERIES
FAST RECOVERY DIODES
Junction Size: Wafer Size: VRRM Class: Passivation Process:
Square 180 mils 4" 200 to 600 V Glassivated MOAT
Reference IR Packaged Part: 20ETF Series
Major Ratings and Characteristics
Parameters
VFM VRRM Maximum Forward Voltage Reverse Breakdown Voltage Range
Units
1300 mV 200 to 600 V
Test Conditions
TJ = 25C, IF = 20 A TJ = 25C, IRRM = 100 A
(1)
(1)Nitrogen flow on die edge.
Mechanical Characteristics
Nominal Back Metal Composition, Thickness Nominal Front Metal Composition, Thickness Chip Dimensions Wafer Diameter Wafer Thickness Maximum Width of Sawing Line Reject Ink Dot Size Ink Dot Location Recommended Storage Environment Cr - Ni - Ag (1 KA - 4 KA - 6 KA) 100% Al, (20 m) 180 x 180 mils (4.57x4.57 mm) - see drawing 100 mm, with std. < 110 > flat 260 m 45 m 0.25 mm diameter minimum See drawing Storage in original container, in dessicated nitrogen, with no contamination
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1
IR180LM..CS02CB Series
Bulletin I0124J 07/97
Ordering Information Table
Device Code
IR
1 1 2 3 4 5 6 7 8 International Rectifier Device Chip Dimension in Mils
180
2
L
3
M
4
06
5
C
6
S02 CB
7 8
Type of Device: L = Wire Bondable Fast Recovery Diode Passivation Process: M = Glassivated MOAT Voltage code: Code x 100 = V RRM Metallization: C = Aluminium (Anode) - Silver (Cathode) Trr code: S02 = 200 nsec CB = Probed Uncut Die (wafer in box)
Available Class 02 = 200 V 04 = 400 V 06 = 600 V
None = Probed Die in chip carrier
Outline Table
All dimensions are in microns
2
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IR180LM..CS02CB Series
Bulletin I0124J 07/97
Wafer Layout
TOP VIEW N 293 Basic Cells
All dimensions are in millimeters
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3


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